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Materials Growth and Processing - NCPST - Page 11

Materials Growth and Processing

Our materials growth and processing research develops novel materials and processing methods directed towards applications in high-tech microelectronics, sensing, and sustainability, working in collaboration with key industrial and scientific partners.

About the Research Area

Novel materials coupled with precision processing techniques enable unique functional devices on sub-micron and nanometre length scales. The ability to work at the interface of materials growth and processing, and to utilise a wide variety of processing techniques, including non-equilibrium plasma methods, enables us to access a broad range of parameter space and to develop innovative new materials, composites and structures suited to specific applications. Our wide range of analysis and characterisation techniques provide us with detailed understanding of the scientific basis of the material and device behaviour and these techniques are designed to maximise their relevance to the high-tech manufacturing sector by replicating industrial conditions to give our work maximum impact.

Research Projects

Materials Growth and Processing Publications

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Materials Growth and Processing

Comparison of ANN and DoE for the prediction of laser-machined micro-channel dimensions. Karazi, S.M; Issa, A; Brabazon, D. Optics and Lasers in Engineering 2009

Materials Growth and Processing

Growth, ambient stability and electrical characterisation of MgO thin films on silicon surfaces. Casey, P; O’Connor, E; Long, R; Brennan, B; Krasnikov, S.A; O’Connell, D; Hurley, P.K; Hughes, G. Microelectronic Engineering 2009

Materials Growth and Processing

Soft breakdown in MgO dielectric layers. Miranda, E; O’Connor, E; Hughes, G; Casey, P; Cherkaoui, K; Monaghan, S; Long, R; O’Connell, D; Hurley, P.K. IEEE International Reliability Physics Symposium Proceedings 2009

Materials Growth and Processing

Calibration and characterisation with a new laser-based magnetostriction measurement system. Rafferty, A; Bakir, S; Brabazon, D; Prescott, T. Materials and Design 2009

Materials Growth and Processing

Detection of Ga suboxides and their impact on III-V passivation and Fermi-level pinning. Hinkle, C.L; Milojevic, M; Brennan, B; Sonnet, A.M; Aguirre-Tostado, F.S; Hughes, G.J; Vogel, E.M; Wallace, R.M. Applied Physics Letters 2009

Materials Growth and Processing, Low-temperature Plasmas

Half-cycle atomic layer deposition reaction study using O3 and H2O oxidation of Al2O3 on In 0.53Ga0.47As. Brennan, B; Milojevic, M; Kim, H.C; Hurley, P.K; Kim, J; Hughes, G; Wallace, R.M. Electrochemical and Solid-State Letters 2009

Low-temperature Plasmas, Materials Growth and Processing

Structural analysis, elemental profiling, and electrical characterization of HfO2 thin films deposited on In0.53 Ga0.47 As surfaces by atomic layer deposition. Long, R.D; O’Connor, É; Newcomb, S.B; Monaghan, S; Cherkaoui, K; Casey, P; Hughes, G; Thomas, K.K; Chalvet, F; Povey, I.M; Pemble, M.E; Hurley, P.K. Journal of Applied Physics 2009

Materials Growth and Processing

Evidence of a new degradation mechanism in high-k dielectrics at elevated temperatures. Sahhaf, S; Degraeve, R; O’Connor, R; Kaczer, B; Zahid, M.B; Roussel, Ph.J; Pantisano, L; Groeseneken, G. IEEE International Reliability Physics Symposium Proceedings 2009

Materials Growth and Processing

Degradation dynamics and breakdown of MgO gate oxides. Miranda, E; O’Connor, E; Hughes, G; Casey, P; Cherkaoui, K; Monaghan, S; Long, R; O’Connell, D; Hurley, P.K. Microelectronic Engineering 2009

Materials Growth and Processing

Mechanical performance of the annealed NiTi Shape Memory Alloy coating onto 316L stainless bio-steel. Abubakar, T; Rahman, M; Dowling, D.P; Stokes, J; Hashmi, M.S.J. Defect and Diffusion Forum 2010

Materials Growth and Processing

Characterization of the carrot defect in 4H-SiC epitaxial layers. Hassan, J; Henry, A; McNally, P.J; Bergman, J.P. Journal of Crystal Growth 2010

Materials Growth and Processing

Growth and properties of SiC on-axis homoepitaxial layers. Hassan, J; Bergman, J.P; Palisaitis, J; Henry, A; McNally, P.J; Anderson, S; Janzén, E. Materials Science Forum 2010

Materials Growth and Processing

Surface modification of HVOF thermal sprayed WC-CoCr coatings by laser treatment. Chikarakara, E; Aqida, S; Brabazon, D; Naher, S; Picas, J.A; Punset, M; Forn, A. International Journal of Material Forming 2010

Materials Growth and Processing

Photoemission study of the SiO2 conversion mechanism to magnesium silicate. Casey, P; Hughes, G. Journal of Applied Physics 2010

Materials Growth and Processing

Designing pulse laser surface modification of H13 steel using response surface method. Aqida, S.N; Brabazon, D; Naher, S. AIP Conference Proceedings 2010

Materials Growth and Processing

Advanced Characterization Techniques for Nanostructures. Brabazon, D; Raffer, A. Emerging Nanotechnologies for Manufacturing 2010

Materials Growth and Processing

Dimensions and cost prediction modelling of Nd: YVO4 laser internal micro-channel fabrication in PMMA. Karazi, S.M; Brabazon, D; Ben Azouz, A. Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational – Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010 2010

Materials Growth and Processing

Photoemission studies of the initial interface formation of ultrathin MgO dielectric layers on the Si(111) surface. Brennan, B; McDonnell, S; Hughes, G. Thin Solid Films 2010

Materials Growth and Processing

Identification and thermal stability of the native oxides on InGaAs using synchrotron radiation based photoemission. Brennan, B; Hughes, G. Journal of Applied Physics 2010

Materials Growth and Processing

Interfacial analysis of InP surface preparation using atomic hydrogen cleaning and Si interfacial control layers prior to MgO deposition. Casey, P; Hughes, G. Applied Surface Science 2010

Materials Growth and Processing

Degradation and breakdown characteristics of thin MgO dielectric layers. O’Connor, R; Hughes, G; Casey, P; Newcomb, S.B. Journal of Applied Physics 2010

Materials Growth and Processing

Time dependent dielectric breakdown and stress induced leakage current characteristics of 8Å EOT HfO2 N-MOSFETS. O’Connor, R; Hughes, G; Kauerauf, T; Ragnarsson, L.-A. IEEE International Reliability Physics Symposium Proceedings 2010

Materials Growth and Processing

(NH4)2S passivation of high-k/In 0.53Ga0.47As interfaces: A systematic study of (NH 4)2S concentration. O’Connor, É; Brennan, B; Contreras, R; Milojevic, M; Cherkaoui, K; Monaghan, S; Newcomb, S.B; Pemble, M.E; Hughes, G; Wallace, R.M; Hurley, P.K. ECS Transactions 2010

Materials Growth and Processing

Laser micro-processing of amorphous and partially crystalline Cu 45Zr48Al7 alloy. Aqida, S.N; Brabazon, D; Naher, S; Kovacs, Z; Browne, D.J. Applied Physics A: Materials Science and Processing 2010

Materials Growth and Processing

Electroluminescence of γ-CuBr thin films via vacuum evaporation depositon. Cowley, A; Lucas, F.O; Gudimenko, E; Alam, M.M; Danieluk, D; Bradley, A.L; McNally, P.J. Journal of Physics D: Applied Physics 2010

Materials Growth and Processing

Spatially resolved investigation of the optical and structural properties of CuCl thin films on Si. Foy, B; McGlynn, E; Cowley, A; Mcnally, P.J; Henry, M.O. AIP Conference Proceedings 2010