Examination of the structural and optical failure of ultra-bright LEDs under varying degrees of electrical stress using synchrotron X-ray topography and optical emission spectroscopy. Lowney, D; McNally, P.J; O’Hare, M; Herbert, P.A.F; Tuomi, T; Rantamäki, R; Karilahti, M; Danilewsky, A.N. Journal of Materials Science: Materials in Electronics 2001
Investigation of mechanical stresses in underlying silicon due to lead-tin solder bumps via synchrotron X-ray topography and finite element analysis. Kanatharana, J; Pérez-Camacho, J.J; Buckley, T; McNally, P.J; Tuomi, T; Danilewsky, A.N; O’Hare, M; Lowney, D; Chen, W. Materials Research Society Symposium Proceedings 2001