Total reflection X-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure. McNally, P.J; Dilliway, G; Bonar, J.M; Willoughby, A; Tuomi, T; Rantamäki, R; Danilewsky, A.N; Lowney, D. Journal of X-Ray Science and Technology 2001

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