White beam synchrotron X-ray topography and X-ray diffraction measurements of epitaxial lateral overgrowth of GaN. Chen, W.M; McNally, P.J; Jacobs, K; Tuomi, T; Danilewsky, A.N; Lowney, D; Kanatharana, J; Knuuttila, L; Riikonen, J. Materials Research Society Symposium – Proceedings 2002

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