Experimental investigation of power deposition and ionization kinetics in an inductively coupled discharge. Rullenraad, W; Crowley, B; Turner, M.M; Vender, D. IEEE International Conference on Plasma Science 2000
Mapping of mechanical, thermomechanical and wire-bond strain fields in packaged Si integrated circuits using synchrotron white beam X-ray topography. McNally, P.J; Rantamäki, R; Tuomi, T; Danilewsky, A.N; Lowney, D; Curley, J.W; Herbert, P.A.F. IEEE Transactions on Components and Packaging Technologies 2001
Quality assessment of sapphire wafers for X-ray crystal optics using white beam synchrotron X-ray topography. Chen, W.M; Mcnally, P.J; Shvydko, Yu.V; Tuomi, T; Lerche, M; Danilewsky, A.N; Kanatharana, J; Lowney, D; O’Hare, M; Knuuttila, L; Rhkonen, J; Rantamäki, R. Physica Status Solidi (A) Applied Research 2001
Angle-resolved photoelectron spectrometry studies of the autoionization of the 2s2 2p2 P triply excited state of atomic lithium: Experimental results and R-matrix calculations. Diehl, S; Cubaynes, D; Zhou, H.L; VoKy, L; Wuilleumier, F.J; Kennedy, E.T; Bizau, J.M; Manson, S.T; Morgan, T.J; Blancard, C; Berrah, N; Bozek, J. Physical Review Letters 2000