Angle-Resolved Photoelectron Spectrometry Studies of the Autoionization of the 2s22p2P Triply Excited State of Atomic Lithium: Experimental Results and R-Matrix Calculations

S. Diehl, D. Cubaynes, H. L. Zhou, L. VoKy, F. J. Wuilleumier, E. T. Kennedy, J. M. Bizau, S. T. Manson, T. J. Morgan, C. Blancard, N. Berrah, and J. Bozek
Phys. Rev. Lett. 84, 1677 – Published 21 February 2000
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Abstract

We have measured the angle-resolved energy dependence of the electrons emitted over the energy range of the triply excited 2s22pP2 lithium resonance using synchrotron radiation. We have also calculated the behavior of the angular distribution parameter β using the R-matrix approximation. Experimental and theoretical results are in good agreement and show deep minima in the 1s2pP1,3 ionic channels. The energy at which the minima occur does not coincide with the resonance energy, but is shifted towards higher energy.

  • Received 2 July 1999

DOI:https://doi.org/10.1103/PhysRevLett.84.1677

©2000 American Physical Society

Authors & Affiliations

S. Diehl1,*, D. Cubaynes1, H. L. Zhou2, L. VoKy3, F. J. Wuilleumier1, E. T. Kennedy4, J. M. Bizau1, S. T. Manson2, T. J. Morgan5, C. Blancard6, N. Berrah7, and J. Bozek8

  • 1Laboratoire de Spectroscopie Atomique et Ionique, UMR 8624 du CNRS, Université Paris-Sud, B. 350, 91405 Orsay, France
  • 2Department of Physics and Astronomy, Georgia State University, Atlanta, Georgia 30303
  • 3Observatoire de la Côte d'Azur, BP 229, 06304 Nice, France
  • 4School of Physical Sciences, Dublin City University, Glasnevin, Dublin 9, Ireland
  • 5Wesleyan University, Department of Physics, Middletown, Connecticut 06459
  • 6DPTA, Centre CEA-DAM, BP 12, 91680-Bruyères-le-Châtel, France
  • 7Department of Physics, Western Michigan University, Kalamazoo, Michigan 40849
  • 8Advanced Light Source, Ernest Orlando Lawrence Berkeley Laboratory, University of California, 1 Cyclotron Road, Berkeley, California 97420

  • *Present address: Laboratoire DIAM, Université Paris VI, place Jussieu, 75231 Paris.

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Vol. 84, Iss. 8 — 21 February 2000

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