Materials Growth and Processing

High resolution photoemission study of the thermal stability of the HfO2/SiOx/Si(111) system. McDonnell, S; Brennan, B; Casey, P; Hughes, G.J. Surface Science 2011

The effect of a post processing thermal anneal on pre-existing and stress induced electrically active defects in ultra-thin SiON dielectric layers. Oconnor, R; Hughes, G. Microelectronics Reliability 2011

Optimisation and scaling of interfacial GeO 2 layers for high-k gate stacks on germanium and extraction of dielectric constant of GeO 2. Murad, S.N.A; McNeill, D.W; Mitchell, S.J.N; Armstrong, B.M; Modreanu, M; Hughes, G; Chellappan, R.K. 2011 International Semiconductor Device Research Symposium, ISDRS 2011 2011

Microscopic origins of the surface exciton photoluminescence peak in ZnO nanostructures. Biswas, M; Jung, Y.S; Kim, H.K; Kumar, K; Hughes, G.J; Newcomb, S; Henry, M.O; McGlynn, E. Physical Review B – Condensed Matter and Materials Physics 2011

Growth of n-type γ-CuCl with improved carrier concentration by pulsed DC sputtering: Structural, electronic and UV emission properties. Rajani, K.V; Olabanji Lucas, F; Daniels, S; Danieluk, D; Bradley, A.L; Cowley, A; Alam, M.M; McNally, P.J. Thin Solid Films 2011

CuBr blue light emitting electroluminescent thin film devices. Lucas, F.O; Cowley, A; Daniels, S; Mcnally, P.J. Physica Status Solidi (C) Current Topics in Solid State Physics 2011

Evaluation of conduction mechanism and electronic parameters for Au/organic-inorganic CuCl hybrid film/ITO structures. Alam, M.M; Cowley, A; Rajani, K.V; Daniels, S; McNally, P.J. Semiconductor Science and Technology 2011

Observation of peripheral charge induced low frequency capacitance-voltage behaviour in metal-oxide-semiconductor capacitors on Si and GaAs substrates. O’Connor, E; Cherkaoui, K; Monaghan, S; O’Connell, D; Povey, I; Casey, P; Newcomb, S.B; Gomeniuk, Y.Y; Provenzano, G; Crupi, F; Hughes, G; Hurley, P.K. Journal of Applied Physics 2012

A combined hard x-ray photoelectron spectroscopy and electrical characterisation study of metal/SiO2/Si(100) metal-oxide- semiconductor structures. Walsh, L.A; Hughes, G; Hurley, P.K; Lin, J; Woicik, J.C. Applied Physics Letters 2012

High resolution synchrotron radiation based photoemission study of the in situ deposition of molecular sulphur on the atomically clean InGaAs surface. Chauhan, L; Hughes, G. Journal of Applied Physics 2012

Improved reliability of Al 2O 3/InGaAs/InP MOS structures through in-situ forming gas annealing. O’Connor, R; Cherkaoui, K; Nagle, R; Schmidt, M; Povey, I.M; Pemble, M; Hurley, P.K. IEEE International Reliability Physics Symposium Proceedings 2012

Microscopic origins of the surface exciton photoluminescence in ZnO nanostructures. Biswas, M; Jung, Y.S; Kim, H.K; Kumar, K; Hughes, G.J; Newcomb, S; Henry, M.O; McGlynn, E. Proceedings of SPIE – The International Society for Optical Engineering 2012

Effect on microstructure of TiO2 rate in Al2O3-TiO2 composite coating produced using plasma spray method. Islak, S; Buytoz, S; Ersoz, E; Orhan, N; Stokes, J; Hashmi, M.S; Somunkiran, I; Tosun, N. Optoelectronics and Advanced Materials, Rapid Communications 2012

Structural investigation of MOVPE-grown GaAs on Ge by x-ray techniques. Wong, C.S; Bennett, N.S; Galiana, B; Tejedor, P; Benedicto, M; Molina-Aldareguia, J.M; McNally, P.J. Semiconductor Science and Technology 2012

Nanocharacterization Techniques for Dental Implant Development. Brabazon, D. Emerging Nanotechnologies in Dentistry 2012

Thermal simulation of laser surface modification of H13 die steel. Aqida, S.N; Naher, S; Brabazon, D. Key Engineering Materials 2012

Microstructure and microhardness characterization of Cr3C 2-SiC coatings produced by the plasma transferred arc method. Islak, S; Eski, Ö; Buytoz, S; Karagöz, M; Stokes, J. Materialpruefung/Materials Testing 2012

Chemical and structural investigations of the interactions of Cu with MnSiO 3 diffusion barrier layers. Casey, P; Bogan, J; McCoy, A; Lozano, J.G; Nellist, P.D; Hughes, G. Journal of Applied Physics 2012

Chemical and structural investigations of the incorporation of metal manganese into ruthenium thin films for use as copper diffusion barrier layers. McCoy, A.P; Casey, P; Bogan, J; Lozano, J.G; Nellist, P.D; Hughes, G. Applied Physics Letters 2012

Photoemission study of the growth of Mn silicate barrier layers on ultra low-k carbon doped oxide surfaces. Bogan, J; Casey, P; McCoy, A; Hughes, G. 2012 IEEE International Interconnect Technology Conference, IITC 2012 2012

(S)TEM analysis of the interdiffusion and barrier layer formation in Mn/Cu heterostructures on SiO2 for interconnect technologies. Lozano, J.G; Lozano-Perez, S; Bogan, J; Wang, Y.C; Brennan, B; Nellist, P.D; Hughes, G. Journal of Physics: Conference Series 2012

Growth characteristics of Mn silicate barrier layers on SiO 2. Casey, P; Bogan, J; McCoy, A.P; Lozano, J.G; Nellist, P.D; Hughes, G. 2012 IEEE International Interconnect Technology Conference, IITC 2012 2012

STEM Analysis Of Cu(Mn) Self-Forming Diffusion Barriers on SiO2 For Applications In The Semiconductor Industry. Lozano, J.G; Bogan, J; Casey, P; McCoy, A; Hughes, G; Nellist, P.D. Microscopy and Microanalysis 2012

Observation of epitaxially ordered twinned zinc aluminate “nanoblades” on c-sapphire. McGlynn, E; Twamley, B; Nanda, K.K; Grabowska, J; Kumar, R.T.R; Newcomb, S.B; Mosnier, J.-P; Henry, M.O. Journal of Materials Science: Materials in Electronics 2012

High speed laser surface modification of Ti-6Al-4V. Chikarakara, E; Naher, S; Brabazon, D. Surface and Coatings Technology 2012