X-ray asterism and the structure of cracks from indentations in silicon. Tanner, B.K; Garagorri, J; Gorostegui-Colinas, E; Elizalde, M.R; Allen, D; McNally, P.J; Wittge, J; Ehlers, C; Danilewsky, A.N. Journal of Applied Crystallography 2016
Angular distribution and circular dichroism in the two-colour XUV+NIR above-threshold ionization of helium. Mazza, T; Ilchen, M; Rafipoor, A.J; Callegari, C; Finetti, P; Plekan, O; Prince, K.C; Richter, R; Demidovich, A; Grazioli, C; Avaldi, L; Bolognesi, P; Coreno, M; O’Keeffe, P; Di Fraia, M; Devetta, M; Ovcharenko, Y; Lyamayev, V; Düsterer, S; Ueda, K; Costello, J.T; Gryzlova, E.V; Strakhova, S.I; Grum-Grzhimailo, A.N; Bozhevolnov, A.V; Kazansky, A.K; Kabachnik, N.M; Meyer, M. Journal of Modern Optics 2016
Angle resolved photoelectron spectroscopy of two-color XUV-NIR ionization with polarization control. Düsterer, S; Hartmann, G; Babies, F; Beckmann, A; Brenner, G; Buck, J; Costello, J; Dammann, L; Fanis, A.D; Geßler, P; Glaser, L; Ilchen, M; Johnsson, P; Kazansky, A.K; Kelly, T.J; Mazza, T; Meyer, M; Nosik, V.L; Sazhina, I.P; Scholz, F; Seltmann, J; Sotoudi, H; Viefhaus, J; Kabachnik, N.M. Journal of Physics B: Atomic, Molecular and Optical Physics 2016
Inner-shell photoexcitations as probes of the molecular ions CH+, OH+, and SiH+: Measurements and theory INNER-SHELL PHOTOEXCITATIONS AS PROBES of the … J.-P. MOSNIER et al.. Mosnier, J.-P; Kennedy, E.T; Van Kampen, P; Cubaynes, D; Guilbaud, S; Sisourat, N; Puglisi, A; Carniato, S; Bizau, J.-M. Physical Review A 2016
Electron power absorption dynamics in capacitive radio frequency discharges driven by tailored voltage waveforms in CF4. Brandt, S; Berger, B; Schüngel, E; Korolov, I; Derzsi, A; Bruneau, B; Johnson, E; Lafleur, T; O’Connell, D; Koepke, M; Gans, T; Booth, J.-P; Donkó, Z; Schulze, J. Plasma Sources Science and Technology 2016