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Publications - NCPST - Page 45

NCPST Publications

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INTEGRAL hard X-ray spectra of the cosmic X-ray background and the galactic ridge. Türler, M; Courvoisier, T.J.-L; Lubiński, P; Neronov, A; Produit, N; Walter, R; Chernyakova, M. Proceedings of Science 2009

Dynamics of magnetized YSO jets: Examples of results from the JETSET network. Cabrit, S; Bocchi, M; Camenzind, M; Ciardi, A; De Colle, F; Downes, T; Ferreira, J; Frank, A; Gracia, J; Lebedev, S; Marrochino, A; Massaglia, S; Matsakos, T; O’Sullivan, J; Stehlé, C; Stute, M; Suzuki-Vidal, F; Tesileanu, O; Tsinganos, K; Zanni, C. Revista Mexicana de Astronomia y Astrofisica: Serie de Conferencias 2009

Multifluid Simulations of the Kelvin-Helmholtz Instability in a Weakly Ionised Plasma. Jones, A.C; Shadmehri, M; Downes, T.P. Astrophysics and Space Science Proceedings 2009

Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks. Miranda, E; Martin-Martinez, J; O’Connor, E; Hughes, G; Casey, P; Cherkaoui, K; Monaghan, S; Long, R; O’Connell, D; Hurley, P.K. Microelectronics Reliability 2009

Effects of the semiconductor substrate material on the post-breakdown current of MgO dielectric layers. Miranda, E; O’Connor, E; Hughes, G; Casey, P; Cherkaoui, K; Monaghan, S; Long, R.D; O’Connell, D; Hurley, P.K. ECS Transactions 2009

Electronic structure of the organic semiconductor copper tetraphenylporphyrin (CuTPP). Reid, I; Zhang, Y; Demasi, A; Blueser, A; Piper, L; Downes, J.E; Matsuura, A; Hughes, G; Smith, K.E. Applied Surface Science 2009

Isotopic fingerprints of gold-containing luminescence centers in 28Si. Steger, M; Yang, A; Sekiguchi, T; Saeedi, K; Thewalt, M.L.W; Henry, M.O; Johnston, K; Riemann, H; Abrosimov, N.V; Churbanov, M.F; Gusev, A.V; Bulanov, A.D; Kaliteevski, I.D; Godisov, O.N; Becker, P; Pohl, H.-J. Physica B: Condensed Matter 2009

Thermal stability of laser treated die material for semi-solid metal forming. Aqida, S.N; Maurel, M; Brabazon, D; Naher, S; Rosso, M. International Journal of Material Forming 2009

Editorial. McNally, P. Journal of Materials Science: Materials in Electronics 2008

White beam topography of 300 mm Si wafers. Danilewsky, A.N; Wittge, J; Rack, A; Weitkamp, T; Simon, R; Baumbach, T; McNally, P. Journal of Materials Science: Materials in Electronics 2008

Electrical characterization of the soft breakdown failure mode in MgO layers. Miranda, E; O’Connor, E; Cherkaoui, K; Monaghan, S; Long, R; O’Connell, D; Hurley, P.K; Hughes, G; Casey, P. Applied Physics Letters 2009

High resolution photoemission study of SiOx/Si(111) interface disruption following in situ HfO2 deposition. McDonnell, S; Brennan, B; Hughes, G. Applied Physics Letters 2009

Impact of nitridation on recoverable and permanent negative bias temperature instability degradation in high-k /metal-gate p-type metal oxide semiconductor field effect transistors. Aoulaiche, M; Kaczer, B; Roussel, Ph.J; O’Connor, R; Houssa, M; De Gendt, S; Maes, H.E; Groeseneken, G. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 2009

Post-breakdown conduction in metal gate/MgO/InP structures. Miranda, E; O’connor, E; Hughes, G; Casey, P; Cherkaoui, K; Monaghan, S; Long, R; O’connelf, D; Hurley, P.K. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009

The role of nitrogen in HfSiON defect passivation. O’Connor, R; Aoulaiche, M; Pantisano, L; Shickova, A; Degraeve, R; Kaczer, B; Groeseneken, G. IEEE International Reliability Physics Symposium Proceedings 2009

Understanding and importance of defects in advanced materials. Pantisano, L; Trojman, L; Aoulaiche, M; O’Connor, R; Kaczer, B; Groeseneken, G. ECS Transactions 2009

Hybrid organic-inorganic spin-on-glass CuCl films for optoelectronic applications. Alam, M.M; Lucas, F.O; Danieluk, D; Bradley, A.L; Rajani, K.V; Daniels, S; McNally, P.J. Journal of Physics D: Applied Physics 2009

Optical properties of undoped and oxygen doped CuCl films on silicon substrates. Danieluk, D; Bradley, A.L; Mitra, A; O’Reilly, L; Lucas, O.F; Cowley, A; McNally, P.J; Foy, B; McGlynn, E. Journal of Materials Science: Materials in Electronics 2009

Electrical properties of γ-CuCl thin films. Lucas, F.O; McNally, P.J; Daniels, S; Martin Taylor, D; Taylor, D.M. Journal of Materials Science: Materials in Electronics 2009

Structural, optical and electrical properties of Co-evaporated CuCl/KCl films. Lucas, F.O; McNally, P.J; Cowley, A; Daniels, S; Bradley, L; Danieluk, D; Taylor, D.M. Physica Status Solidi (C) Current Topics in Solid State Physics 2009

UV emission on a Si substrate: Optical and structural properties of γ-CuCl on Si grown using liquid phase epitaxy techniques. Cowley, A; Foy, B; Danilieuk, D; McNally, P.J; Bradley, A.L; McGlynn, E; Danilewsky, A.N. Physica Status Solidi (A) Applications and Materials Science 2009

Carbothermal reduction vapor phase transport growth of ZnO nanostructures: Effects of various carbon sources. Biswas, M; McGlynn, E; Henry, M.O; McCann, M; Rafferty, A. Journal of Applied Physics 2009

Growth and field emission properties of ZnO nanostructures deposited by a novel pulsed laser ablation source on silicon substrates. McLoughlin, C; Hough, P; Costello, J; McGlynn, E; Mosnier, J.P. Ultramicroscopy 2009

Strong multiphoton-absorption-induced UV luminescence from ZnO nanorod arrays grown by vapour-liquid-solid mechanism. Das, S.K; Bock, M; Biswas, M; Mcglynn, E; Grunwald, R. CLEO/Europe – EQEC 2009 – European Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference 2009

Dislocations and dislocation reduction in space grown GaSb. Danilewsky, A.N; Cröll, A; Tonn, J; Schweizer, M; Lauer, S; Benz, K.W; Tuomi, T; Rantamäki, R; McNally, P; Curley, J. Crystal Research and Technology 2009

FEA of residual stress during HVOF thermal spraying. Stokes, J; Looney, L. Journal of Materials Engineering and Performance 2009

Deposition and characterization of HVOF thermal sprayed functionally graded coatings deposited onto a lightweight material. Hasan, M; Stokes, J; Looney, L; Hashmi, M.S.J. Journal of Materials Engineering and Performance 2009