Synchrotron X-ray topographic study of dislocations in GaAs detector crystals grown by vertical gradient freeze technique. Tuomi, T; Juvonen, M; Rantamaki, R; Hjelt, K; Bavdaz, M; Nenonen, S; Gagliardi, M.-A; McNally, P.J; Danilewsky, A.N; Prieur, E; Taskinen, M; Tuominen, M. Materials Research Society Symposium – Proceedings 1998

Leave a Reply

Your email address will not be published. Required fields are marked *

Fill out this field
Fill out this field
Please enter a valid email address.
You need to agree with the terms to proceed