Anomalous positive-bias temperature instability of high-k/metal gate nMOSFET devices with Dy2O3 capping. O’Connor, R; Chang, V.S; Pantisano, L; Ragnarsson, L.-A; Aoulaiche, M; O’Sullivan, B; Adelmann, C; Van Elshocht, S; Lehnen, P; Yu, H; Groeseneken, G. IEEE International Reliability Physics Symposium Proceedings 2008
Polarization control in two-color above-threshold ionization of atomic helium. Meyer, M; Cubaynes, D; Glijer, D; Dardis, J; Hayden, P; Hough, P; Richardson, V; Kennedy, E.T; Costello, J.T; Radcliffe, P; Düsterer, S; Azima, A; Li, W.B; Redlin, H; Feldhaus, J; Taïeb, R; Maquet, A; Grum-Grzhimailo, A.N; Gryzlova, E.V; Strakhova, S.I. Physical Review Letters 2008
Characterization and applications of glassy barrier on polymeric microcavities. Riaz, A; Gandhiraman, R.P; Dimov, I.K; Basabe-Desmonts, L; Ricco, A.J; Ducrée, J; Daniels, S; Lee, L.P. Proceedings of Conference, MicroTAS 2009 – The 13th International Conference on Miniaturized Systems for Chemistry and Life Sciences 2009