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Publications - NCPST - Page 43

NCPST Publications

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Improved buffered block forward backward method applied to 3D scattering problems. Mullen, M; Brennan, C; Downes, T. IET Conference Publications 2008

Design of a capillary viscometer with numerical and computational methods. Shah, A; Brabazon, D; Looney, L. International Journal of Manufacturing Technology and Management 2008

The multiwavelength variability of 3C 273. Soldi, S; Türler, M; Paltani, S; Aller, H.D; Aller, M.F; Burki, G; Chernyakova, M; Lähteenmäki, A; McHardy, I.M; Robson, E.I; Staubert, R; Tornikoski, M; Walter, R; Courvoisier, T.J.-L. Astronomy and Astrophysics 2008

A rotating hollow cone anisotropy of TeV emission from binary systems. Neronov, A; Chernyakova, M. Astrophysical Journal 2008

Marcos, a numerical tool for the simulation of multiple time-dependent non-linear diffusive shock acceleration. Ferrand, G; Downes, T; Marcowith, A. Monthly Notices of the Royal Astronomical Society 2008

Multiwavelength properties of γ-ray loud binary systems. Chernyakova, M; Neronov, A. International Journal of Modern Physics D 2008

Monitoring the black hole binary GRS 1758-258 with INTEGRAL and RXTE. Pottschmidt, K; Chernyakova, M; Lubinski, P; Migliari, S; Smith, D.M; Zdziarski, A.A; Tomsick, J.A; Kreykenbohm, I; Kretschmar, P; Kalemci, E. Proceedings of Science 2008

The role of Kelvin-Helmholtz instability in dusty and partially ionized outflows. Shadmehri, M; Downes, T.P. Monthly Notices of the Royal Astronomical Society 2008

Rectangular-section mirror light pipes. Swift, P.D; Lawlor, R; Smith, G.B; Gentle, A. Solar Energy Materials and Solar Cells 2008

Electronic structure characterization of ultra low-k carbon doped oxide using soft X-ray emission spectroscopy. Reid, I; Zhang, Y; DeMasi, A; Hughes, G; Smith, K.E. Thin Solid Films 2008

A note on linking electrical current, magnetic fields, charges and the pole in a barn paradox in special relativity. McGlynn, E; Van Kampen, P. European Journal of Physics 2008

Antimony for n -type metal oxide semiconductor ultrashallow junctions in strained Si: A superior dopant to arsenic?. Bennett, N.S; Smith, A.J; Gwilliam, R.M; Webb, R.P; Sealy, B.J; Cowern, N.E.B; O’Reilly, L; McNally, P.J. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 2008

Constraints on micro-Raman strain metrology for highly doped strained Si materials. O’Reilly, L; Horan, K; McNally, P.J; Bennett, N.S; Cowern, N.E.B; Lankinen, A; Sealy, B.J; Gwilliam, R.M; Noakes, T.C.Q; Bailey, P. Applied Physics Letters 2008

Growth and characterisation of epitaxially ordered zinc aluminate domains on c-sapphire. Grabowska, J; Rajendra Kumar, R.T; McGlynn, E; Nanda, K.K; Newcomb, S.B; McNally, P.J; O’Reilly, L; Mosnier, J.-P; Henry, M.O. Thin Solid Films 2008

X-ray excited optical luminescence of Mg-doped GaN. Lankinen, A; Svensk, O; Mattila, M; Tuomi, T.O; Lipsanen, H; McNally, P.J; O’Reilly, L; Paulmann, C. Journal of X-Ray Science and Technology 2008

Growth and characterisation of thin MgO layers on Si(100) surfaces. Casey, P; Hughes, G; O’connor, E; Long, R.D; Hurley, P.K. Journal of Physics: Conference Series 2008

Dislocations at the interface between sapphire and GaN. Lankinen, A; Lang, T; Suihkonen, S; Svensk, O; Säynätjoki, A; Tuomi, T.O; McNally, P.J; Odnoblyudov, M; Bougrov, V; Danilewsky, A.N; Bergman, P; Simon, R. Journal of Materials Science: Materials in Electronics 2008

Laser surface modification of tool steel for semi-solid steel forming. Brabazon, D; Naher, S; Biggs, P. Solid State Phenomena 2008

Glazing of tool dies for semi-solid steel forming. Brabazon, D; Naher, S; Biggs, P. International Journal of Material Forming 2008

Displacement of charge and conduction current in collisionless planar sheaths during voltage transients. Braithwaite, N.St.J; LauroTaroni, L; Haas, F.A; Turner, M.M. Contributions to Plasma Physics 2008

GaAs interfacial self-cleaning by atomic layer deposition. Hinkle, C.L; Sonnet, A.M; Vogel, E.M; McDonnell, S; Hughes, G.J; Milojevic, M; Lee, B; Aguirre-Tostado, F.S; Choi, K.J; Kim, H.C; Kim, J; Wallace, R.M. Applied Physics Letters 2008

Ubiquitous relaxation in BTI stressing-new evaluation and insights. Kaczer, B; Grasser, T; Roussel, Ph.J; Martin-Martinez, J; O’Connor, R; O’Sullivan, B.J; Groeseneken, G. IEEE International Reliability Physics Symposium Proceedings 2008

Indium stability on InGaAs during atomic H surface cleaning. Aguirre-Tostado, F.S; Milojevic, M; Hinkle, C.L; Vogel, E.M; Wallace, R.M; McDonnell, S; Hughes, G.J. Applied Physics Letters 2008

Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation. Cherkaoui, K; Monaghan, S; Negara, M.A; Modreanu, M; Hurley, P.K; O’Connell, D; McDonnell, S; Hughes, G; Wright, S; Barklie, R.C; Bailey, P; Noakes, T.C.Q. Journal of Applied Physics 2008

In situ H2S passivation of In0.53Ga 0.47As/InP metal-oxide-semiconductor capacitors with atomic-layer deposited HfO2 gate dielectric. O’Connor, E; Long, R.D; Cherkaoui, K; Thomas, K.K; Chalvet, F; Povey, I.M; Pemble, M.E; Hurley, P.K; Brennan, B; Hughes, G; Newcomb, S.B. Applied Physics Letters 2008

SILC defect generation spectroscopy in HfSiON using constant voltage stress and substrate hot electron injection. O’Connor, R; Pantisano, L; Degraeve, R; Kauerauf, T; Kaczer, B; Roussel, Ph.J; Groeseneken, G. IEEE International Reliability Physics Symposium Proceedings 2008

Photoemission studies of the interface formation of ultrathin MgO dielectric layers on the oxidised Si(111) surface. Brennan, B; McDonnell, S; Hughes, G. Journal of Physics: Conference Series 2008

Anomalous positive-bias temperature instability of high- κ /metal gate devices with Dy2 O3 capping. O’Connor, R; Chang, V.S; Pantisano, L; Ragnarsson, L.-A; Aoulaiche, M; O’Sullivan, B; Groeseneken, G. Applied Physics Letters 2008

Electron energy dependence of defect generation in high- k gate stacks. O’Connor, R; Pantisano, L; Degraeve, R; Kauerauf, T; Kaczer, B; Roussel, P; Groeseneken, G. Journal of Applied Physics 2008