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Publications - NCPST - Page 40

NCPST Publications

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Materials Growth and Processing

Photoemission studies of pulsed-RF plasma nitrided ultra-thin SiON dielectric layers. O’Connor, R; McDonnell, S; Hughes, G; Smith, K.E. Surface Science 2006

Materials Growth and Processing

Electrical properties of HfO2 films formed by ion assisted deposition. Cherkaoui, K; Negara, A; McDonnell, S; Hughes, G; Modreanu, M; Hurley, P.K. 2006 25th International Conference on Microelectronics, MIEL 2006 – Proceedings 2006

Space and Astrophysical Plasmas

2003-2005 INTEGRAL and XMM-Newton observations of 3C 273. Chernyakova, M; Neronov, A; Courvoisier, T.J.-L; Türler, M; Soldi, S; Beckmann, V; Lubinski, P; Walter, R; Page, K.L; Stuhlinger, M; Staubert, R; McHardy, I.M. Astronomy and Astrophysics 2007

Space and Astrophysical Plasmas

Simulations of time-dependent non-linear multiple diffusive shock acceleration. Ferrand, G; Downes, T; Marcowith, A. Proceedings of the 30th International Cosmic Ray Conference, ICRC 2007 2007

Energy Applications

Control of ZnO nanorod array density by Zn supersaturation variation and effects on field emission. Rajendra Kumar, R.T; McGlynn, E; McLoughlin, C; Chakrabarti, S; Smith, R.C; Carey, J.D; Mosnier, J.P; Henry, M.O. Nanotechnology 2007

Energy Applications

(20-23) ZnO thin films grown by pulsed laser deposition on Ce O2 -buffered r -sapphire substrate. Ducl̀re, J.-R; Doggett, B; Henry, M.O; McGlynn, E; Rajendra Kumar, R.T; Mosnier, J.-P; Perrin, A; Guilloux-Viry, M. Journal of Applied Physics 2007

Energy Applications

Characterization of nitrogen-doped ZnO thin films grown by plasma-assisted pulsed laser deposition on sapphire substrates. Chakrabarti, S; Doggett, B; O’Haire, R; McGlynn, E; Henry, M.O; Meaney, A; Mosnier, J.-P. Superlattices and Microstructures 2007

Energy Applications

Electrical characterisation of phosphorus-doped ZnO thin films grown by pulsed laser deposition. Doggett, B; Chakrabarti, S; O’Haire, R; Meaney, A; McGlynn, E; Henry, M.O; Mosnier, J.P. Superlattices and Microstructures 2007

Energy Applications

Morphological control of ZnO nanostructures on silicon substrates. Rajendra Kumar, R.T; Grabowska, J; Mosnier, J.P; Henry, M.O; McGlynn, E. Superlattices and Microstructures 2007

Energy Applications

Splitting of point defect energy levels in wurtzite crystals under uniaxial stresses applied along arbitrary directions. McGlynn, E; Henry, M.O. Physical Review B – Condensed Matter and Materials Physics 2007

Energy Applications

Growth controlled and laser induced nanostructures in thin nonlinear optical ZnO layers. Grunwald, R; Neumann, U; Seeber, W; Lange, H; Mosnier, J.-R; O’Haire, R; McGlynn, E. Physics and Chemistry of Glasses: European Journal of Glass Science and Technology Part B 2007

Energy Applications

Nitrogen doping of ZnO thin films grown by plasma-assisted pulsed-laser deposition. Novotny, M; Duclère, J.-R; McGlynn, E; Henry, O; O’Haire, R; Mosnier, J.-P. Journal of Physics: Conference Series 2007

Energy Applications

P-type nitrogen- And phosphorus-doped ZnO thin films grown by pulsed laser deposition on sapphire substrates. Mosnier, J.-P; Chakrabarti, S; Doggett, B; McGlynn, E; Henry, M.O; Meaney, A. Proceedings of SPIE – The International Society for Optical Engineering 2007

Energy Applications

Morphological control of ZnO nanostructures grown on silicon. Rajendra Kumar, R.T; Grabowska, J; Mosnier, J.P; Henry, M.O; McGlynn, E. Proceedings of SPIE – The International Society for Optical Engineering 2007

Sulphur overlayers on the Au(1 1 0) surface: LEED and TPD study. Krasnikov, S.A; Hughes, G; Cafolla, A.A. Surface Science 2007

Introducing gyroscopes quantitatively without putting students into a spin. McGlynn, E. European Journal of Physics 2007

Authors’ response to IR Edmonds and DJ Carter. Swift, P.D; Smith, G.B; Franklin, J. Lighting Research & Technology 2006

Diagnostics and Sensors

The evaluation of mechanical stresses developed in underlying silicon substrates due to electroless nickel under bump metallization using synchrotron X-ray topography. Noonan, D; McNally, P.J; Chen, W.-M; Lankinen, A; Knuuttila, L; Tuomi, T.O; Danilewsky, A.N; Simon, R. Microelectronics Journal 2006

Laser Plasmas and Spectroscopy

Two-color photoionization in xuv free-electron and visible laser fields. Meyer, M; Cubaynes, D; O’Keeffe, P; Luna, H; Yeates, P; Kennedy, E.T; Costello, J.T; Orr, P; Taïeb, R; Maquet, A; Düsterer, S; Radcliffe, P; Redlin, H; Azima, A; Plönjes, E; Feldhaus, J. Physical Review A – Atomic, Molecular, and Optical Physics 2006

Laser Plasmas and Spectroscopy

Spectroscopic characterization of vacuum ultraviolet free electron laser pulses. Düsterer, S; Radcliffe, P; Geloni, G; Jastrow, U; Kuhlmann, M; Plönjes, E; Tiedtke, K; Treusch, R; Feldhaus, J; Nicolosi, P; Poletto, L; Yeates, P; Luna, H; Costello, J.T; Orr, P; Cubaynes, D; Meyer, M. Optics Letters 2006

Laser Plasmas and Spectroscopy

Plasma parametrization by analysis of time-resolved laser plasma image spectra. Doria, D; Kavanagh, K.D; Costello, J.T; Luna, H. Measurement Science and Technology 2006

Materials Growth and Processing

Analysis of the effects of 3DP parameters on part feature dimensional accuracy. Szucs, T.D; Brabazon, D. 18th Solid Freeform Fabrication Symposium, SFF 2007 2007

Materials Growth and Processing

Computational and experimental analysis of particulate distribution during Al-SiC MMC fabrication. Naher, S; Brabazon, D; Looney, L. Composites Part A: Applied Science and Manufacturing 2007

Materials Growth and Processing

Simultaneous extraction of recoverable and permanent components contributing to bias-temperature instability. Grasser, T; Kaczer, B; Hehenberger, P; Gös, W; O’Connor, R; Reisinger, H; Gustin, W; Schlünder, C. Technical Digest – International Electron Devices Meeting, IEDM 2007

Materials Growth and Processing

Frequency dispersion reduction and bond conversion on n -type GaAs by in situ surface oxide removal and passivation. Hinkle, C.L; Sonnet, A.M; Vogel, E.M; McDonnell, S; Hughes, G.J; Milojevic, M; Lee, B; Aguirre-Tostado, F.S; Choi, K.J; Kim, J; Wallace, R.M. Applied Physics Letters 2007

Materials Growth and Processing

Characterisation and passivation of interface defects in (1 0 0)-Si/SiO2/HfO2/TiN gate stacks. Hurley, P.K; Cherkaoui, K; McDonnell, S; Hughes, G; Groenland, A.W. Microelectronics Reliability 2007

Materials Growth and Processing

A Dy2O3-capped HfO2 dielectric and TaCx-based metals enabling low-Vt single-metal-single- dielectric gate stack. Chang, V.S; Ragnarsson, L.-Å; Pourtois, G; O’Connor, R; Adelmann, C; Van Elshocht, S; Delabie, A; Swerts, J; Van Der Heyden, N; Conard, T; Cho, H.-J; Akheyar, A; Mitsuhashi, R; Witters, T; O’Sullivan, B.J; Pantisano, L; Rohr, E; Lehnen, P; Kubicek, S; Schram, T; De Gendt, S; Absil, P.P; Biesemans, S. Technical Digest – International Electron Devices Meeting, IEDM 2007