Evaluation of the optical properties of epitaxial lateral overgrown gallium nitride on sapphire and the role of optically active metastable defects using cathodoluminescence and photoluminescence spectroscopy. Ryan, B.J; Lowney, D.P; Henry, M.O; McNally, P.J; McGlynn, E; Jacobs, K; Considine, L. Thin Solid Films 2005
Synchrotron X-ray topography study of defects in indium antimonide P-I-N structures grown by metal organic vapour phase epitaxy. Riikonen, J; Tuomi, T; Lankinen, A; Sormunen, J; Säynätjoki, A; Knuuttila, L; Lipsanen, H; McNally, P.J; O’Reilly, L; Danilewsky, A; Sipilä, H; Vaijärvi, S; Lumb, D; Owens, A. Journal of Materials Science: Materials in Electronics 2005
Progress report on compact system for point projection X-ray absorption spectroscopy and imaging of laser produced plasmas. Dardis, J; Murphy, A; De Luna, H; Kennedy, E.T; Seugnet, A; Orr, P; Greenwood, J; McKenna, C; Lewis, C.L.S; Costello, J.T. Proceedings of SPIE – The International Society for Optical Engineering 2005