Providing a homogeneous visual field with an integrating sphere. Maher, A.-M; Swift, P.D. Physiological Measurement 2002
Examination of mechanical stresses in silicon substrates due to lead-tin solder bumps via micro-Raman spectroscopy and finite element modelling. Kanatharana, J; Pérez-Camacho, J.J; Buckley, T; McNally, P.J; Tuomi, T; Riikonen, J; Danilewsky, A.N; O’Hare, M; Lowney, D; Chen, W; Rantamäki, R; Knuuttila, L. Semiconductor Science and Technology 2002
Evaluation of mechanical stresses in silicon substrates due to lead-tin solder bumps via synchrotron X-ray topography and finite element modeling. Kanatharana, J; Pérez-Camacho, J.J; Buckley, T; McNally, P.J; Tuomi, T; Danilewsky, A.N; O’Hare, M; Lowney, D; Chen, W; Rantamäki, R; Knuuttila, L; Riikonen, J. Microelectronic Engineering 2002
Investigation of strain induced effects in silicon wafers due to proximity rapid thermal processing using micro-Raman spectroscopy and synchrotron X-ray topography. Lowney, D; Perova, T.S; Nolan, M; McNally, P.J; Moore, R.A; Gamble, H.S; Tuomi, T; Rantamäki, R; Danilewsky, A.N. Semiconductor Science and Technology 2002
VUV and soft X-ray emission from pre-plasmas irradiated with picosecond and femtosecond pulses. Murphy, A; Hirsch, J.S; Kilbane, D; Kennedy, E.T; Khater, M.A; Mosnier, J.-P; Neogi, A; O’Sullivan, G; Lewis, C.L.S; Topping, S; Clarke, R; Divall, E; Foster, P; Hooker, C; Langley, A; Neely, D; Dunne, P; Costello, J.T. Proceedings of SPIE – The International Society for Optical Engineering 2002
Measurement of quenching coefficients and development of calibration methods for quantitative spectroscopy of plasmas at elevated pressures. Francis, A; Gans, T; Niemi, K; Czarnetzki, U; Schulz-von der Gathen, V; Döbele, H.F. Proceedings of SPIE – The International Society for Optical Engineering 2002