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Bert Ellingboe speaks at the KISM - NCPST

Bert Ellingboe speaks at the KISM

NCPST PI Bert Ellingboe delivered an invited talk on “The Advantages of Hairpin-Probe over Langmuir-Probe for Measuring Negative-Ion Density using Laser Photo-Detachment” at the Korean International Semiconductor Conference on Manufacturing Technology in Busan, Korea in November 2022.