Identification of donor-related impurities in ZnO using photoluminescence and radiotracer techniques

Karl Johnston, Martin O. Henry, Deirdre McCabe, Enda McGlynn, Marc Dietrich, Eduardo Alves, and Matthew Xia
Phys. Rev. B 73, 165212 – Published 20 April 2006

Abstract

The results of photoluminescence measurements on ZnO implanted with stable and radioactive isotopes of Zn and Ga are presented. The donor-related exciton feature I8 at 3.3600eV is suggested to be due to bound exciton recombination at Ga donors. The I1 line at 3.3718eV is also likely to be due to Ga, and is attributed to ionized Ga donor bound exciton recombination. A feature at 3.3225eV is observed following transmutation of radioactive Ga into stable Ge, and is attributed to Ge. Finally, a damage-related band is observed in the region of 1.8eV when the recoil energy of the decay is capable of dislodging the host atoms from their respective lattice sites.

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  • Received 5 November 2004

DOI:https://doi.org/10.1103/PhysRevB.73.165212

©2006 American Physical Society

Authors & Affiliations

Karl Johnston*, Martin O. Henry, Deirdre McCabe, and Enda McGlynn

  • National Centre for Plasma Science and Technology, School of Physical Sciences, Dublin City University, Glasnevin, Dublin 9, Ireland

Marc Dietrich

  • CERN, PH Department, 1211 Geneva 23, Switzerland

Eduardo Alves

  • Instituto Technológico e Nuclear, P.O. Box 21, 2686-953 Sacavém, Portugal

Matthew Xia

  • Department of Physics, Columbia University, 538 W. 120th Street, New York, New York 10027, USA

  • *Electronic address: karl.johnston@gmail.com

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Issue

Vol. 73, Iss. 16 — 15 April 2006

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