Anomalous Behavior of the Near-Threshold Photoionization Cross Section of the Neon Isoelectronic Sequence: A Combined Experimental and Theoretical Study

H. S. Chakraborty, A. Gray, J. T. Costello, P. C. Deshmukh, G. N. Haque, E. T. Kennedy, S. T. Manson, and J-P. Mosnier
Phys. Rev. Lett. 83, 2151 – Published 13 September 1999
PDFExport Citation

Abstract

We present a combined theoretical and experimental investigation of photoionization along the Ne isoelectronic sequence and show that the near-threshold behavior of the cross section for Si4+ differs radically from the nearby ions in the sequence. We demonstrate that the general nature of the underlying physics implies that dramatic changes in near-threshold behavior may be expected for many other ions.

  • Received 24 May 1999

DOI:https://doi.org/10.1103/PhysRevLett.83.2151

©1999 American Physical Society

Authors & Affiliations

H. S. Chakraborty1, A. Gray2, J. T. Costello2, P. C. Deshmukh1, G. N. Haque3, E. T. Kennedy2,*, S. T. Manson4, and J-P. Mosnier2

  • 1Department of Physics, Indian Institute of Technology, Madras 600036, India
  • 2Centre for Laser Plasma Research, School of Physical Sciences, Dublin City University, Dublin 9, Ireland
  • 3Department of Physics, Morehouse College, Atlanta, Georgia 30314
  • 4Department of Physics and Astronomy, Georgia State University, Atlanta, Georgia 30303

  • *Electronic address: eugene.kennedy@dcu.ie

References (Subscription Required)

Click to Expand
Issue

Vol. 83, Iss. 11 — 13 September 1999

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×