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Advanced Characterisation Techniques for Nanostructures

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Micro and Nanomanufacturing Volume II

Abstract

This chapter presents some of the most important currently utilised techniques for the characterisation of nanostructures and nanoparticles. The techniques presented here are grouped into categories of topology, internal structure and compositional investigation. Topological techniques presented here include field emission scanning electron microscopy (FESEM), scanning probe microscopy (SPM), optical microscopy (confocal and NSOM) and particle size distribution with dynamic light scattering (DLS). Internal structure techniques presented include transmission electron microscope (TEM), magnetic resonance force microscope (MRFM) and X-ray diffraction (XRD). Compositional techniques presented include X-ray photoelectron spectroscopy (XPS), energy dispersive X-ray spectroscopy (EDS), secondary ion mass spectroscopy (SIMS) and Auger electron spectroscopy (AES). To highlight the current capabilities and applications of these techniques, case studies from recent literature are presented.

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Authors and Affiliations

  1. School of Mechanical & Manufacturing Engineering, Dublin City University, Dublin 9, Ireland

    Brian Freeland, Inam Ul Ahad, Greg Foley & Dermot Brabazon

  2. I-Form, Advanced Processing Technology Research Centre, Dublin City University, Dublin 9, Ireland

    Brian Freeland, Inam Ul Ahad, Greg Foley & Dermot Brabazon

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  1. Brian Freeland
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  2. Inam Ul Ahad
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  3. Greg Foley
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  4. Dermot Brabazon
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Correspondence to Dermot Brabazon .

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Editors and Affiliations

  1. School of Interdisciplinary Studies, Kansas State University, Manhattan, Kansas, USA

    Mark J. Jackson

  2. School of Mathematics and Physics, University of Lincoln, Lincoln, United Kingdom

    Waqar Ahmed

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Freeland, B., Ahad, I.U., Foley, G., Brabazon, D. (2018). Advanced Characterisation Techniques for Nanostructures. In: Jackson, M., Ahmed, W. (eds) Micro and Nanomanufacturing Volume II. Springer, Cham. https://doi.org/10.1007/978-3-319-67132-1_4

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  • DOI: https://doi.org/10.1007/978-3-319-67132-1_4

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  • Print ISBN: 978-3-319-67130-7

  • Online ISBN: 978-3-319-67132-1

  • eBook Packages: EngineeringEngineering (R0)

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